发明名称 |
SPECIMEN ANALYZING ELEMENT |
摘要 |
<p>A specimen analyzing element, comprising a transparent member (1) in which a micro flow passage (2) is formed, a pair of bar-like members (3, 4) buried in the transparent member (1), having end faces (3b, 4c) disposed oppositely to each other through the micro flow passage (2) formed in the transparent member (1), and having a refraction factor different from that of the transparent member (1), and a scattered light condensing part (31) buried in the transparent member (1) and condensing scattered light from a measurement part (2a).</p> |
申请公布号 |
WO2006004176(A1) |
申请公布日期 |
2006.01.12 |
申请号 |
WO2005JP12527 |
申请日期 |
2005.06.30 |
申请人 |
TAMA-TLO CORPORATION;TERADA, NOBUYUKI;OHKUBO, TOSHIFUMI;YOSHIDA, YOSHIKAZU |
发明人 |
OHKUBO, TOSHIFUMI;YOSHIDA, YOSHIKAZU |
分类号 |
(IPC1-7):G01N21/05;G01N15/14;G01N37/00;G01N21/47 |
主分类号 |
(IPC1-7):G01N21/05 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|