发明名称 METHOD AND SYSTEM FOR EXPOSURE
摘要 <P>PROBLEM TO BE SOLVED: To improve matching deviation precision in an actual exposure stage by applying a statistical model and predicting a matching deviation correction value. <P>SOLUTION: An exposure method has a calculating means (S13) of calculating a 1st matching deviation value (optimum matching deviation value) from existent data, a predicting means (S14) of performing calculation processing for the calculated 1st matching deviation value with the statistical model and predicting a 2nd matching deviation correction value (matching deviation value used for this lot) to be used in an exposure processing stage, and an exposure processing means (S16) of performing the exposure processing stage by using the predicted 2nd matching deviation correction value. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006013178(A) 申请公布日期 2006.01.12
申请号 JP20040189042 申请日期 2004.06.28
申请人 TOSHIBA CORP 发明人 TAKAKUWA MAHO
分类号 H01L21/027;G03F9/00 主分类号 H01L21/027
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