发明名称 THROUGH-HOLE FORMING METHOD, SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To form a through-hole which connects electrically the front and back surfaces of a semiconductor substrate consisting of a ä100} silicon substrate and is normal to the a semiconductor substrate, using a very simple method. SOLUTION: A semiconductor surface opening larger than a given area is formed on the ä100} silicon substrate having a surface protective film by removing the protective film. The opening is then subjected to a laser processing to form a through-hole smaller than the given area in inner diameter, and the inner diameter of the through-hole is widened by anisotropic etching, which is finished when the inner diameter reaches the size of the given area. As a result, the through-hole of the given size is formed without crystallizing a ä111} crystal face inversely tapering from the substrate surface toward the through-hole interior. In addition, the laser processing eliminates dross or debris produced around or inside the processed hole and creates the high quality through-hole having the inner surface formed of a very smooth crystal face. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006013454(A) 申请公布日期 2006.01.12
申请号 JP20050141086 申请日期 2005.05.13
申请人 CANON INC 发明人 MORIMOTO HIROYUKI
分类号 H01L23/52;H01L21/00;H01L21/20;H01L21/3205;H01L21/768;H05K3/02 主分类号 H01L23/52
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