发明名称 WIRING STRUCTURE FOR SEMICONDUCTOR DEVICE AND ITS FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a wiring structure for a semiconductor device and its forming method. SOLUTION: The semiconductor device is provided with an interlayer dielectric arranged on a semiconductor substrate 100, first/second contact structures 181, 182 penetrating the interlayer dielectric, and a metal wiring 220 arranged on the interlayer dielectric and connected to the first/second contact structures. The first contact structure includes a first plug and a second plug 200 which are successively laminated. The second contact structure includes the second plug. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006013431(A) 申请公布日期 2006.01.12
申请号 JP20050071421 申请日期 2005.03.14
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 PARK JIN-TAEK;PARK JONG-HO;HUR SUNG-HOI;KIM HYUN-SUK
分类号 H01L21/3205;H01L21/768;H01L21/4763;H01L21/8234;H01L21/8247;H01L27/088;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/3205
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