发明名称 |
WIRING STRUCTURE FOR SEMICONDUCTOR DEVICE AND ITS FORMING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a wiring structure for a semiconductor device and its forming method. SOLUTION: The semiconductor device is provided with an interlayer dielectric arranged on a semiconductor substrate 100, first/second contact structures 181, 182 penetrating the interlayer dielectric, and a metal wiring 220 arranged on the interlayer dielectric and connected to the first/second contact structures. The first contact structure includes a first plug and a second plug 200 which are successively laminated. The second contact structure includes the second plug. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006013431(A) |
申请公布日期 |
2006.01.12 |
申请号 |
JP20050071421 |
申请日期 |
2005.03.14 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
PARK JIN-TAEK;PARK JONG-HO;HUR SUNG-HOI;KIM HYUN-SUK |
分类号 |
H01L21/3205;H01L21/768;H01L21/4763;H01L21/8234;H01L21/8247;H01L27/088;H01L27/10;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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