发明名称 ELECTRONIC BEAM EXPOSURE DEVICE
摘要 PROBLEM TO BE SOLVED: To solve the problem of withstand voltage property by eliminating needs to apply high voltage to a BAA electrode, and to realize processing operation at high speed. SOLUTION: After the electronic beam EB irradiated from an electron source 101 is accelerated and is almost parallelized, the device is provided with a means for dividing the electronic beam to multi-electron beams with an aperture array 121, BAA 122 as a blanking means for turning on and off each multi-electron beam, a lens array 124 as a means for converging each multi-electron beam, and a contracted projection system 130 for contracting and projecting the multi-electron beams. The BAA 122 is provided in an intermediate voltage area to the final acceleration potential of the electronic beam. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006013386(A) 申请公布日期 2006.01.12
申请号 JP20040192090 申请日期 2004.06.29
申请人 CANON INC;HITACHI HIGH-TECHNOLOGIES CORP 发明人 OKUNUKI MASAHIKO;OTA HIROYA
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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