RE-TEST METHOD OF SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To extract and test a semiconductor device put on a carrier again. SOLUTION: (1) A first semiconductor device carrier supporting a plurality of semiconductor devices after the test is provided. (2) A reserving device extracts the semiconductor device from the first semiconductor device carrier, and put it on a film frame based on the information of a first map having the information including a positional coordinate to be arranged. (3) The film frame is put on a test device, and the test device re-tests the plurality of semiconductor devices based on the information of the first map. (4) The film frame supporting the plurality of semiconductor devices is put on the reserving device. The reserving device extracts the plurality of semiconductor devices as good articles based on the re-test result of the test device, and sequentially puts them on a second semiconductor device carrier by the grade of the re-test result. COPYRIGHT: (C)2006,JPO&NCIPI