发明名称 WAVELENGTH DETERMINATION DEVICE AND WAVELENGTH DETERMINATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a wavelength determination device and a wavelength determination method capable of determining a wavelength of a laser beam emitted from an external resonator type semiconductor laser, over a wide range. SOLUTION: The laser beam emitted from the external resonator type semiconductor laser 50 is determined in two steps by two detectors 202, 203. The detector 202 is provided with an optical wedge 204, and light intensity of a reflected beam thereof is detected by a two-divided detector 206. The detector 203 is provided with an optical wedge 205, and light intensity of a reflected beam thereof is detected by a two-divided detector 207. Wedge angles and plate thicknesses of the two optical wedges 204, 205 are regulated to generate the substantially same interference fringe even when receiving respectively different wavelength ranges of laser beams. A rough wavelength range of the laser beam is determined thereby using a differential value from the two-divided detector 206, and a detail level of wavelength is determined thereafter using a differential value from the two-divided detector 207. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006010499(A) 申请公布日期 2006.01.12
申请号 JP20040187883 申请日期 2004.06.25
申请人 SONY CORP 发明人 TANAKA FUJI
分类号 G01J3/453;H01S5/065;H01S5/0687 主分类号 G01J3/453
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