发明名称 LITHOGRAPHY APPARATUS AND MANUFACTURING METHOD OF DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide lithography apparatus in which possibility of damage is reduced in the case that a support structure of a substrate and/or a device having a pattern formed thereon are/is collided with an edge of a support surface. <P>SOLUTION: The lithography apparatus includes an illumination system for providing a radiation beam, a support surface having edges, and a support structure for supporting an object that is moved in such a manner of crossing the radiation beam. The support structure is movably supported on the support surface. The apparatus further includes a rim associated with the support surface. The support structure and the rim are configured such that the support structure is moved in a first direction to the rim until it is collided with the rim. Total force generated by collision on the support structure is directed at least partially to be out of a second direction opposite to the first direction. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006013514(A) 申请公布日期 2006.01.12
申请号 JP20050185128 申请日期 2005.06.24
申请人 ASML NETHERLANDS BV 发明人 TEGENBOSCH HENRICUS G;CORNELISSEN SEBASTIAAN MARIA J
分类号 H01L21/027;G03B27/42;G03F7/20;H01L21/68 主分类号 H01L21/027
代理机构 代理人
主权项
地址