发明名称 SEMICONDUCTOR APPARATUS, MANUFACTURING METHOD THEREOF AND ELECTRONIC DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor apparatus in which Si-H coupling in a switching transistor region is stable and oxygen missing is not generated in a ferroelectric oxide film in a dielectric capacitor region, and to provide a manufacturing method thereof and an electronic device utilizing the same. SOLUTION: A source-drain diffusion region 4 and a channel region 3 are formed on a polysilicon thin film formed on a substrate 1 such as a glass, and a gate electrode 6 is further formed via a gate insulating film 5. A hydrogenated silicon nitride film 11 is formed on an interlayer insulating film 8, thereby enabling to keep the hydrogen concentration of an active element region including a thin film transistor 7 for switching high, and the Si-H coupling is stabilized. Also, a ferrorelectric film 13 is provided on the film 11 via a lower electrode 12 formed of a conductive oxide film, thereby enabling to keep oxygen concentration of a ferroelectric capacitance element layer high and the generation of oxygen missing in the film 13 can be prevented. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006013081(A) 申请公布日期 2006.01.12
申请号 JP20040187036 申请日期 2004.06.24
申请人 NEC CORP 发明人 TANABE HIROSHI
分类号 H01L27/105;H01L21/336;H01L21/8246;H01L29/786 主分类号 H01L27/105
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