发明名称 Methods of fabricating semiconductor heterostructures
摘要 Dislocation pile-ups in compositionally graded semiconductor layers are reduced or eliminated, thereby leading to increased semiconductor device yield and manufacturability. This is accomplished by introducing a semiconductor layer having a plurality of threading dislocations distributed substantially uniformly across its surface as a starting layer and/or at least one intermediate layer during growth and relaxation of the compositionally graded layer. The semiconductor layer may include a seed layer disposed proximal to the surface of the semiconductor layer and having the threading dislocations uniformly distributed therein.
申请公布号 US2006009012(A1) 申请公布日期 2006.01.12
申请号 US20050227770 申请日期 2005.09.15
申请人 AMBERWAVE SYSTEMS CORPORATION 发明人 LEITZ CHRISTOPHER;VINEIS CHRISTOPHER;WESTHOFF RICHARD;YANG VICKY;CURRIE MATTHEW
分类号 H01L21/20;C30B25/02;C30B29/52;H01L21/205;H01L21/302;H01L21/8238;H01L31/0328 主分类号 H01L21/20
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