发明名称 Producing halftone phase mask by providing mask on chromium oxide or chromium mask layer, etching chromium oxide or chromium mask layer, and selectively etching refractory metal silicon nitride phase shifter layer using hard mask in plasma
摘要 <p>Producing a halftone phase mask involves providing a mask on a chromium oxide or chromium mask layer, etching chromium oxide or chromium mask layer to form a hard mask in a first etching step, and selectively etching a refractory metal silicon nitride phase shifter layer using the hard mask in a plasma with a chlorine- and/or hydrogen-chloride-containing main gas in a second etching step with a predetermined cathode power of at least 20 W. Production of a halftone phase mask having a silicon dioxide substrate (1), an overlying refractory metal silicon nitride (SixNy) phase shifter layer, and an overlying chromium oxide or chromium mask layer involves providing a mask on the chromium oxide or chromium mask layer (3), etching chromium oxide or chromium mask layer to form a hard mask from the chromium oxide or chromium mask layer in a first etching step, and selectively etching the refractory metal SixNy phase shifter layer (2) using the hard mask in a plasma with a chlorine-containing and/or hydrogen-chloride-containing main gas in a second etching step with a predetermined cathode power of at least 20 W.</p>
申请公布号 DE10344048(A1) 申请公布日期 2006.01.12
申请号 DE2003144048 申请日期 2003.09.23
申请人 INFINEON TECHNOLOGIES AG 发明人 MATHUNI, JOSEF;RUHL, GUENTHER
分类号 G03F1/00 主分类号 G03F1/00
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