发明名称 Manipulator for non-destructive materials testing device e.g. X-ray testing device, using 2 independently displaced linear axes for movement of pivot support for testing device
摘要 <p>The manipulator has a support (2) to which the materials testing device (4,6) is attached, which pivots about a pivot pin (18) and which is displaced in a longitudinal direction (10,14). The manipulator has 2 linear axes (8,12) to which the support is hinged, which are independently displaced in the longitudinal direction. Also included are Independent claims for the following: (A) a non-destructive materials testing device; (B) a control method for positioning an X-ray testing device via a manipulator.</p>
申请公布号 DE212004000031(U1) 申请公布日期 2006.01.12
申请号 DE20042100031U 申请日期 2004.05.12
申请人 GE INSPECTION TECHNOLOGIES GMBH 发明人
分类号 G01B5/00;G01N23/00 主分类号 G01B5/00
代理机构 代理人
主权项
地址