发明名称 SEMICONDUCTOR STORAGE DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for realizing a semiconductor memory with which process consistency with a logic transistor and a low cost can be realized, although the semiconductor memory instead of an SRAM is requested with progress of microfabrication. <P>SOLUTION: In a semiconductor device having a logic and a memory in the same chip, a unit memory cell of the memory is provided with at least two transistors. One transistor is a writing transistor for putting in/out a stored charge, and the other transistor is a reading transistor where a conductance between a source and a drain changes depending on the stored charge which is put in/out by the writing transistor. In the semiconductor device, a gate insulating film thicker than the transistor of the logic is used for the reading transistor, and a diffusion layer structure which is the same as the logic part is used for the reading transistor. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006012878(A) 申请公布日期 2006.01.12
申请号 JP20040183338 申请日期 2004.06.22
申请人 RENESAS TECHNOLOGY CORP 发明人 ISHII TOMOYUKI;MINE TOSHIYUKI;SANO TOSHIAKI;KAMESHIRO NORIFUMI
分类号 H01L27/108;G11C11/405;H01L21/8234;H01L21/8239;H01L21/8242;H01L27/105;H01L27/11;H01L29/10 主分类号 H01L27/108
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