| 摘要 |
<p>The present invention relates to a method for evaluating an output signal (1) of a Device Under Test (DUT), wherein said Device Under Test (DUT) outputs said output signal (1) in response to an input signal provided by an Automated Test Equipment ATE, said method comprising the steps of: generating a difference signal (4) representing the difference between said output signal (1) of said Device Under Test (DUT) and a reference signal (3), integrating said difference signal (4) during a clock period (11a, 11b) respectively, resulting in an integrated difference signal (6), and evaluating said integrated difference signal (6) with regard to a bit level to be assigned to said output signal (1) of said Device Under Test (DUT) during the respective clock period (11a, 11b).</p> |
