发明名称 SEMICONDUCTOR APPARATUS AND MANUFACTURING METHOD THEREFOR
摘要 <P>PROBLEM TO BE SOLVED: To improve the step coverage of a dielectric film and to reduce the disposal amount of a dielectric substance. <P>SOLUTION: A semiconductor apparatus manufacturing method comprises processes of patterning a bottom electrode 11 on a base film 8; applying the dielectric substance onto the bottom electrode 11 using an ink jet-type application mechanism, forming the dielectric film 12 on the bottom electrode 11 by heating the applied dielectric substance, and forming a top electrode on the dielectric film 12. The process of forming the top electrode comprises processes of forming an interlayer insulation film on the base film 8 and on the dielectric film 12, forming an opening existing above the dielectric film in the interlayer insulation film, depositing a conductor inside the opening and on the interlayer insulation film, and forming the top electrode by removing the conductor from above the interlayer insulation film. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006012894(A) 申请公布日期 2006.01.12
申请号 JP20040183659 申请日期 2004.06.22
申请人 SEIKO EPSON CORP 发明人 INOUE TAKEAKI
分类号 H01L21/316;B05C5/00;B05D1/26;B05D7/00;H01L21/31;H01L21/768;H01L21/822;H01L21/8242;H01L27/04;H01L27/108 主分类号 H01L21/316
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