发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SYSTEM FOR CONVEYING SEMICONDUCTOR DEVICE AND IN-CONVEYANCE CONTAINER OXIDATION DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To form an oxide film whose film thickness can be controlled in a conveyance container. SOLUTION: An in-conveyance container oxidation device 10 is configured of a hoop 10a to be used as a sealed conveyance container. An environment switching means 20 for switching an environment in the hoop 10a to an oxidation environment and a non-oxidation environment as necessary is installed in the hoop 10a. The environment switching means 20 is constituted of a gas feeding pipe 21 opened in the hoop 10a, a filter 22 installed in the gas feeding pipe 21 and a gas switching valve 23. The inside of the hoop 10a is set in the oxidation environment by the environment switching means 20 while a semiconductor wafer is housed in the hoop 10a and conveyed so that an oxide film can be formed with desired film thickness. COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006013221(A) |
申请公布日期 |
2006.01.12 |
申请号 |
JP20040189842 |
申请日期 |
2004.06.28 |
申请人 |
RENESAS TECHNOLOGY CORP |
发明人 |
HOSHI HATSUMI;SASAKI YASUSHI |
分类号 |
H01L21/31;B65G49/00;B65G49/07;H01L21/673 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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