SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of shortening test time. SOLUTION: Four items of test data SI1_0-SI1_3 inputted from four input terminals 101_1-101_4 are merged at a merge circuit 50 to create serial data SCANIN1 at one test cycle. The serial data SCANIN1 is transmitted to a shift register constituting a scan test circuit 40. The serial data SCANOUT1 transmitted from the shift register is outputted to a tester 2 from four output terminals 102_1-102_4. COPYRIGHT: (C)2006,JPO&NCIPI