发明名称 PHOTORESIST COMPOSITION
摘要 <p>The present invention provides a photoresist composition and more particularly, a photoresist composition comprising a) a novolak resin, b) a diazide compound, and c) a solvent containing propylene glycol methyl ether acetate (PGMEA) and 2,2,4-triemthyl-1,3-penthanediolmonoisobutylate (TMPMB). The photoresist composition according to the invention has excellent coating uniformity and stain inhibitory properties after coating so that it can be easily applied to real industrial fields and it can improve working environments due to the reduction of amounts to be consumed, the decrease of time to be required for manufacture, etc. when manufactured on a large scale.</p>
申请公布号 KR20060003295(A) 申请公布日期 2006.01.10
申请号 KR20040052124 申请日期 2004.07.05
申请人 DONGJIN SEMICHEM CO., LTD. 发明人 KANG, HOON;LEE, SEUNG UK;JUN, WOO SIK;PARK, DAE YOUN;KIM, JU HYUK;KIM, BYUNG UK
分类号 G03F7/008;G03F7/004 主分类号 G03F7/008
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