发明名称 |
INTERFERENCE METHOD OF MEASUREMENT OF RADIUS OF CURVATURE OF OPTICAL SURFACE |
摘要 |
FIELD: measurement technology. ^ SUBSTANCE: surface to be controlled in placed into interferometer at co-focal position while taking the position as zero reading. Then the controlled surface is displaced twice fro random length and value of displacement of controlled surface is measured by displacement transducer. Number of interference band in interference pattern is registered by means of digital processing of interferogram. Radius of curvature of controlled surface is calculated by means of equation offered in the invention. Value of displacement of controlled item and error in fixation of the item are reduced. ^ EFFECT: improved precision of measurement. ^ 3 dwg |
申请公布号 |
RU2267744(C1) |
申请公布日期 |
2006.01.10 |
申请号 |
RU20040118177 |
申请日期 |
2004.06.15 |
申请人 |
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发明人 |
POLOVTSEV IGOR' GEORGIEVICH;SIMONOVA GALINA VLADIMIROVNA |
分类号 |
G01B11/255 |
主分类号 |
G01B11/255 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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