SEMICONDUCTOR MEMORY DEVICE FOR TESTING OPERATION ABILITY OF INTERNAL VOLTAGE GENERATOR,申请号KR20040049908-传众专利搜索

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发明名称	SEMICONDUCTOR MEMORY DEVICE FOR TESTING OPERATION ABILITY OF INTERNAL VOLTAGE GENERATOR
摘要
申请公布号	KR20060000918(A)	申请公布日期	2006.01.06
申请号	KR20040049908	申请日期	2004.06.30
申请人	HYNIX SEMICONDUCTOR INC.	发明人	KU, YOUNG JUN;YOON, SEOK CHEOL
分类号	G11C5/14;G11C29/00	主分类号	G11C5/14
代理机构		代理人
主权项
地址

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