发明名称 apparatus and method for controlling diffusion
摘要 A method and device for reducing a dopant diffusion rate in a doped semiconductor region is provided. The methods and devices include selecting a plurality of dopant elements. Selection of a plurality of dopant elements includes selecting a first dopant element with a first atomic radius larger than a host matrix atomic radius and selecting a second dopant element with a second atomic radius smaller than a host matrix atomic radius. The methods and devices further include selecting amounts of each dopant element of the plurality of dopant elements wherein amounts and atomic radii of each of the plurality of dopant elements complement each other to reduce a host matrix lattice strain. The methods and devices further include introducing the plurality of dopant elements to a selected region of the host matrix and annealing the selected region of the host matrix.
申请公布号 US2006003559(A1) 申请公布日期 2006.01.05
申请号 US20050215466 申请日期 2005.08.30
申请人 MICRON TECHNOLOGY, INC. 发明人 FARRAR PAUL A.;ELDRIDGE JEROME M.
分类号 H01L21/477;H01L21/265;H01L29/167;H01L29/207 主分类号 H01L21/477
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