发明名称 ALIGNER AND EXPOSURE METHOD
摘要 <P>PROBLEM TO BE SOLVED: To stably form a resist pattern with high resolution. <P>SOLUTION: An aligner 100 is provided with an optical source 101 irradiating a mask 102 with light, a projection optical system 103 projecting the image of the mask 102 on a wafer 110 and a liquid supply device 105 filling a part between the projection optical system 103 and the wafer 110 with medium liquid 109. Saturation cyclic hydrocarbon or its dielectric is used as medium liquid 109. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006004964(A) 申请公布日期 2006.01.05
申请号 JP20040176451 申请日期 2004.06.15
申请人 NEC ELECTRONICS CORP 发明人 NAKADA DAISAKU
分类号 H01L21/027;G03B19/12;G03B27/42;G03F7/20 主分类号 H01L21/027
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