发明名称 Plasma enhanced deposited, fully oxidized PSG film
摘要 A method of forming a plasma enhanced deposited oxide film on a substrate includes introducing into a chamber containing the substrate silane gas and a dopant gas such as phosphine. The chamber is pressurized and energy is applied to create a plasma. The energy may be a dual frequency energy. The gas rates and pressure are selected to porduce a plasma enhanced deposited oxide film on a substrate having a Si-O-Si bond peak absorbance in the IR spectrum of at least 1092 cm<SUP>-1</SUP>.
申请公布号 US2006001127(A1) 申请公布日期 2006.01.05
申请号 US20040953573 申请日期 2004.09.30
申请人 INTERSIL AMERICAS INC. 发明人 PENTAS KATIE H.;BORDELON MARK D.;LINN JACK H.
分类号 H01L21/4763;H01L21/31;H01L23/58 主分类号 H01L21/4763
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