发明名称 |
Plasma enhanced deposited, fully oxidized PSG film |
摘要 |
A method of forming a plasma enhanced deposited oxide film on a substrate includes introducing into a chamber containing the substrate silane gas and a dopant gas such as phosphine. The chamber is pressurized and energy is applied to create a plasma. The energy may be a dual frequency energy. The gas rates and pressure are selected to porduce a plasma enhanced deposited oxide film on a substrate having a Si-O-Si bond peak absorbance in the IR spectrum of at least 1092 cm<SUP>-1</SUP>.
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申请公布号 |
US2006001127(A1) |
申请公布日期 |
2006.01.05 |
申请号 |
US20040953573 |
申请日期 |
2004.09.30 |
申请人 |
INTERSIL AMERICAS INC. |
发明人 |
PENTAS KATIE H.;BORDELON MARK D.;LINN JACK H. |
分类号 |
H01L21/4763;H01L21/31;H01L23/58 |
主分类号 |
H01L21/4763 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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