发明名称 Positioning apparatus and photolithography apparatus including the same
摘要 A positioning apparatus includes first and second stages, a pair of first mirrors having reflective surfaces disposed on the first stage at an acute angle with a vertical axis, a pair of second mirrors disposed on the second stage and having reflective surfaces orthogonal to the vertical axis, a reference structure functioning as a reference for measuring the vertical position of the second stage, a pair of third mirrors disposed on the reference structure and having reflective surfaces orthogonal to the vertical axis, and a pair of interferometers for measuring the vertical position of the second stage using the first, second, and third mirrors.
申请公布号 US2006001889(A1) 申请公布日期 2006.01.05
申请号 US20050157781 申请日期 2005.06.21
申请人 CANON KABUSHIKI KAISHA 发明人 TANAKA HIDEO
分类号 G01B11/00;G03F7/20;H01L21/68 主分类号 G01B11/00
代理机构 代理人
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