Optical arrangement, for quantitative measurement of optical axis position of optoelectronic sensor system, with which diffraction image is created and compared with reference image to enable adjustments to be made

摘要

Device for quantitative measurement of the optical axis position of an optoelectronic sensor system in which light from a parallel radiation source (9) is detected by a sensor system (2). Between radiation source and sensor system is a diffractive medium (6) that generates a diffraction image in the sensor plane, the position of which is dependent on linear and rotation displacement of the source. The image is compared with a reference image and dependent on the comparison a movement system (7) is used to adjust the position of the source until the diffraction image matches the reference image within a given limit. An independent claim is included for a method using the above arrangement.