发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To control the crack of an insulating substrate of a semiconductor device, and the embrittlement of solder. SOLUTION: The semiconductor device 1 is a semiconductor power module provided with: a metal base 2 formed into a shape of a rectangle; an insulating substrate 3 formed into a shape of a rectangle whose area is smaller than that of the metal base 2 arranged on the first principal surface of the metal base 2; a lower electrode 4 pasted to the insulating substrate 3 on the second principal surface of the insulating substrate 3; a Pb free solder film 5 wherein resin particles are mixed after pasting the lower electrode 4 and the metal base 2; an upper electrode 7 provided on the first principal surface of the insulating substrate 3; semiconductor devices 6a and 6b provided on the first principal surface of the upper electrode 7; and a bonding wire 9 which connects electrically the upper electrode 7 with the semiconductor devices 6a and 6b. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006005111(A) 申请公布日期 2006.01.05
申请号 JP20040179117 申请日期 2004.06.17
申请人 TOSHIBA CORP 发明人 NABA TAKAYUKI;SHIROYA TSUNEO
分类号 H01L25/07;H01L25/18 主分类号 H01L25/07
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