Method for testing the error ratio of a device using a preliminary probability

摘要

A method for testing the (Bit) Error Ratio BER of a device against a maximal allowable (Bit) Error Ratio BER_limit with an early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability F for the entire test. Ns bits of the output of the device are measured, thereby ne erroneous bits of these ns bits are detected. PD_high and/or PD_low are obtained, whereby PD_high is the worst possible likelihood distribution and PD_low is the best possible likelihood distribution containing the measured ne erroneous bits with a single step wrong decision probability D, which is smaller than the probability F for the entire test. The average numbers of erroneous bits NE_high and NE_low for PD_high and PD_low are obtained. NE_high and NE_low are compared with NE_limit=BER_limit ns. If NE_limit the test is stopped. Sequential sampling with two one-tailed parametric hypothesis test for the poisson distribution.