发明名称 IMAGE EVALUATION METHOD OF PLASMA DISPLAY PANEL
摘要 <P>PROBLEM TO BE SOLVED: To provide an image evaluation method for properly evaluating and inspecting uneven luminance in units of discharge cells caused in a plasma display panel. <P>SOLUTION: The image evaluation method comprises the steps of: picking up the image of the plasma display panel; applying an isolation point elimination process to the picked up image; applying a peripheral comparison process to the image subjected to the isolation point elimination process wherein an amount based on a difference between image data of a target pixel and image data of its surrounding pixels is used for image data of the target pixel; applying a maximum value filter process to the image subjected to the peripheral comparison process wherein the maximum value of the image data of pixel in the vicinity region of the target pixel is used for the image data of the target pixel; applying a minimum value filter process to the image subjected to the maximum value filter process wherein the minimum value of the image data of the pixels in the vicinity of the target pixel is used for image data of the target pixel; applying a binarization process to the image subjected to the minimum value filter process; and evaluating the plasma display panel by using the image subjected to the binarization process. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006005429(A) 申请公布日期 2006.01.05
申请号 JP20040176840 申请日期 2004.06.15
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TOSHIMA AKIRA;KOBAYASHI KOTARO;INOUE RYUICHI;OTANI TOSHIYA
分类号 H04N17/04;G01M11/00;G06T1/00;G09G3/20;G09G3/28;H04N5/66 主分类号 H04N17/04
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