发明名称 |
COMPOUND, POLYMER COMPOUND, POSITIVE TYPE RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a polymer compound capable of constituting a positive type resist pattern having excellent resolution and capable of favorably resolving a resist pattern even by using an acid generating agent having weak strength of an acid generated, a compound suitable for producing the polymer compound and a positive type resist composition containing the polymer compound and to provide a method for forming resist pattern by using the positive type resist composition. <P>SOLUTION: The compound is represented by general formula (1). The polymer compound comprises a unit (a1) represented by general formula (11). The positive type resist composition comprises the polymer compound. The method for forming resist pattern comprises using the positive type resist composition. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006002073(A) |
申请公布日期 |
2006.01.05 |
申请号 |
JP20040181067 |
申请日期 |
2004.06.18 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
OGATA TOSHIYUKI;MATSUMARU SHOGO;HANEDA HIDEO |
分类号 |
C08F20/28;G03F7/004;G03F7/033;G03F7/039;H01L21/027 |
主分类号 |
C08F20/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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