发明名称 System and method for testing artificial memory
摘要 A system for testing an artificial memory includes a monitor ( 10 ), a driver ( 20 ), and an executing means ( 30 ). The monitor includes a command line interface ( 101 ) for inputting commands and parameters. The driver includes a command line editor ( 201 ), which is adapted to be activated before the command line interface is used; a command translator ( 202 ) for invoking corresponding subprograms according to the input commands and parameters; an error flag ( 203 ) for indicating whether any error occurred during the testing; and an error counter ( 204 ) for counting the number of times any error occurred during the testing. The executing means is for testing the memory with reading/writing of sequence bit strings, and returning test results to the monitor via the driver. A related method for testing an artificial memory is also provided.
申请公布号 US2006005088(A1) 申请公布日期 2006.01.05
申请号 US20040024506 申请日期 2004.12.29
申请人 HON HAI PRECISION INDUSTRY CO., LTD. 发明人 ZENG XIN;HE TANG
分类号 G11C29/00;G01R31/28 主分类号 G11C29/00
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