发明名称 SILICON WAFER AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide the manufacturing method of a silicon wafer of high quality can be manufactured, where a COP free region and an oxygen deposition free region are sufficiently secured, a haze and foreign matters are not burnt on a wafer surface, and a contact mark with a jig does not exist on a wafer rear face. <P>SOLUTION: In the method, the silicon wafer is manufactured from silicon single crystal. The manufacturing method of the silicon wafer performs a double-side polishing process for mirror-finishing both faces of the wafer, an annealing process for annealing the wafer which is mirror-finished, and a re-polishing process for re-polishing the surface or both faces of the annealed wafer on the wafer which is cut from silicon single crystal. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006004983(A) 申请公布日期 2006.01.05
申请号 JP20040176784 申请日期 2004.06.15
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 KIMURA AKIHIRO
分类号 H01L21/304;B24B37/08;C30B29/06;C30B33/00;H01L21/302;H01L21/306;H01L21/322;H01L21/324 主分类号 H01L21/304
代理机构 代理人
主权项
地址