发明名称 JITTER MEASURING METHOD AND JITTER MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To grasp accurately pattern-dependent jitter. SOLUTION: Waveform information of a data signal wherein noise jitter is suppressed by averaging data signals to be measured is generated by time-series data at fixed intervals shorter than the period of a clock signal having a frequency corresponding to a bit rate (S1), and a wide-band clock reproduction processing is performed to the waveform information (S2), and a clock signal including the pattern-dependent jitter is reproduced. Then, the reproduced clock signal is subjected to phase detection to thereby determine phase variation of each bit position (S3), and the phase variation is subjected to filter processing in a jitter measuring band specified beforehand by the bit rate of the data signal to the phase variation, to thereby determine the pattern-dependent jitter in each bit (S4). COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006003255(A) 申请公布日期 2006.01.05
申请号 JP20040180874 申请日期 2004.06.18
申请人 ANRITSU CORP 发明人 MOCHIZUKI TAKESHI;NISHIOHARA MASANORI
分类号 G01R29/02 主分类号 G01R29/02
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