| 摘要 |
There is provided a test circuit comprising a test signal input for receiving a test signal, a hysteretic comparator having first and second comparison inputs and an output indicating the result of the comparison, and a delay circuit. The first comparison input is connected to the test signal input and the second comparison input is connected to receive the test signal on the test signal input via the delay circuit, the comparator thereby comparing the test signal on the test signal input with a delayed version of itself. Also provided is a test system comprising a first integrated circuit including the abovementioned test circuit, a second integrated circuit comprising test signal generation circuitry, and an interconnection between the generation circuitry and the test signal input of the test circuit of the first integrated circuit.
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