发明名称 METHOD FOR REPRESENTING SUBSTRATE SHAPE
摘要 PROBLEM TO BE SOLVED: To establish the method of calculating the curvature radius of each of the tips of recesses and protrusions in the texture of a substrate. SOLUTION: AFM measured data is smoothed by weighted movement averaging for weighting points to obtain an average. Protrusions and recesses are detected from the inclinations of two points in the adjacent 3 data of the smoothed data. In each of the tips of the detected protrusions and recesses, a curvature radius is calculated from the 3 data including each point before/after the tip by using circle equation. There is a strong correlation between the calculated curvature radiuses Rcp and Rcv of the protrusion and recess tips and OR. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006004504(A) 申请公布日期 2006.01.05
申请号 JP20040178793 申请日期 2004.06.16
申请人 FUJI ELECTRIC HOLDINGS CO LTD 发明人 KUSAKAWA KAZUHIRO
分类号 G11B5/84;G11B5/73 主分类号 G11B5/84
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