发明名称 AlN substrates and method for cleaning them
摘要 <p>An Al x Ga y In 1-x-y N substrate in which particles having a grain size of at least 0.2 µm on a surface of the Al x Ga y In 1-x-y N substrate are at most 20 in number when a diameter of the Al x Ga y In 1-x-y N substrate is two inches, and a cleaning method with which the Al x Ga y In 1-x-y N substrate can be obtained are provided. Further, an Al x Ga y In 1-x-y N substrate (51) in which, in a photoelectron spectrum of a surface of the Al x Ga y In 1-x-y N substrate (51) by X-ray photoelectron spectroscopy with a detection angle of 10°, a ratio between a peak area of C 1s electrons and a peak area of N 1s electrons (C 1s electron peak area / N 1s electron peak area) is at most 3, and a cleaning method with which the Al x Ga y In 1-x-y N substrate can be obtained are provided. Still further, an AlN substrate (52) in which, in a photoelectron spectrum of a surface of the AlN substrate (52) by X-ray photoelectron spectroscopy with a detection angle of 10°, a ratio between a peak area of Al 2s electrons and a peak area of N 1s electrons (Al 2s electron peak area / N 1s electron peak area) is at most 0.65 and a cleaning method with which the AlN substrate can be obtained are provided.</p>
申请公布号 EP1612301(A2) 申请公布日期 2006.01.04
申请号 EP20050013957 申请日期 2005.06.28
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 UEMURA, TOMOKI;ISHIBASHI, KEIJI;FUJIWARA, SHINSUKE;NAKAHATA, HIDEAKI
分类号 C30B33/00;C30B29/40;H01L31/00 主分类号 C30B33/00
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