| 摘要 |
A method of investigating a sample, the sample comprising at least a first material in order to determine the presence of at least one further material, the method comprising the steps of: Irradiating the sample with electromagnetic radiation in the range from 25GHz to 100THz; Detecting radiation reflected from sample; Determining a parameter related to the amplitude of the radiation, which is reflected from the sample, in the time domain; Analysing the parameter derived in step (c) in order to determine if the sample further comprises the at least one further material wherein the irradiating and reflected radiation passes through a window member having a refractive index that falls between the refractive indices of the at least first and at least one further materials. The window member can be made of quartz, silicon, polythene, polystyrene or TPX. |
