发明名称 Bitline of semiconductor device having stud type capping layer and method for fabricating the same
摘要 A semiconductor device with a bitline structure has a stud type capping layer. A method of fabricating the same achieves sufficient process margins and reduces parasitic capacitance. The device may include an insulating film formed on a semiconductor substrate and having a bitline contact and a groove-shaped bitline pattern, a bitline formed on the bitline contact and on a portion of the bitline pattern and that is surrounded by the insulating film, and a bitline capping layer formed on the bitline within the bitline pattern and the insulating film that protrudes from the insulating film. A protruded portion of the bitline capping layer is wider than the width of the bitline.
申请公布号 US6982199(B2) 申请公布日期 2006.01.03
申请号 US20030636131 申请日期 2003.08.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEONG MUN-MO;LEE CHANG-HUHN;YOSHIDA MAKOTO
分类号 H01L21/8242;H01L21/3205;H01L21/768;H01L23/52;H01L23/522;H01L27/105;H01L27/108;H01L29/40 主分类号 H01L21/8242
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