发明名称 Lateral FET structure with improved blocking voltage and on resistance performance and method
摘要 In one embodiment, a lateral FET structure ( 30 ) is formed in a body of semiconductor material ( 32 ). The structure ( 30 ) includes a plurality non-interdigitated drain regions ( 39 ) that are coupled together with a conductive layer ( 57 ), and a plurality of source regions ( 34 ) that are coupled together with a different conductive layer ( 51 ). One or more interlayer dielectrics ( 53,54 ) separate the two conductive layers ( 51,57 ). The individual source regions ( 34 ) are absent small radius fingertip regions.
申请公布号 US6982461(B2) 申请公布日期 2006.01.03
申请号 US20030729292 申请日期 2003.12.08
申请人 SEMICONDUCTOR COMPONENTS INDUSTRIES, L.L.C. 发明人 HOSSAIN ZIA;TU SHANGHUI;ISHIGURO TAKESHI;NAIR RAJESH S.
分类号 H01L29/76;H01L21/336;H01L29/06;H01L29/10;H01L29/417;H01L29/78;H01L29/94 主分类号 H01L29/76
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