发明名称 |
Lateral FET structure with improved blocking voltage and on resistance performance and method |
摘要 |
In one embodiment, a lateral FET structure ( 30 ) is formed in a body of semiconductor material ( 32 ). The structure ( 30 ) includes a plurality non-interdigitated drain regions ( 39 ) that are coupled together with a conductive layer ( 57 ), and a plurality of source regions ( 34 ) that are coupled together with a different conductive layer ( 51 ). One or more interlayer dielectrics ( 53,54 ) separate the two conductive layers ( 51,57 ). The individual source regions ( 34 ) are absent small radius fingertip regions.
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申请公布号 |
US6982461(B2) |
申请公布日期 |
2006.01.03 |
申请号 |
US20030729292 |
申请日期 |
2003.12.08 |
申请人 |
SEMICONDUCTOR COMPONENTS INDUSTRIES, L.L.C. |
发明人 |
HOSSAIN ZIA;TU SHANGHUI;ISHIGURO TAKESHI;NAIR RAJESH S. |
分类号 |
H01L29/76;H01L21/336;H01L29/06;H01L29/10;H01L29/417;H01L29/78;H01L29/94 |
主分类号 |
H01L29/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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