发明名称 Apparatus and method using wavefront phase measurements to determine geometrical relationships
摘要 An apparatus includes a microwave source that produces a microwave feed beam, and a first pair of microwave sensors that each intercept and receive a portion of the microwave feed beam. The two microwave sensors are spaced apart from each other along a first-pair axis. A first phase-comparison device has as it inputs the output signals of the two microwave sensors, and as an output a first phase comparison of the first-sensor output signal and the second-sensor output signal. A first geometrical calculator has as an input the first phase comparison and as an output a geometrical relationship of the first-pair axis to an other feature. This geometrical relationship output may be used to generate a control signal that is used to alter the geometrical relationship. There may be additional microwave sensors operating in a similar manner but spaced to provide information for other geometrical axes or allow improvements in geometrical measurements.
申请公布号 US6982678(B2) 申请公布日期 2006.01.03
申请号 US20040817400 申请日期 2004.04.02
申请人 RAYTHEON COMPANY 发明人 OBERT THOMAS L.;BROWN KENNETH W.;RATTRAY ALAN A.;GERSTENBERG JOHN;GALLIVAN JAMES R.
分类号 H01Q13/00;G01S3/48;G01S7/40;H01Q3/26;H01Q3/30 主分类号 H01Q13/00
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