发明名称 Molded wafer scale cap array
摘要 An array of caps is taught for protecting features on a semiconductor wafer. The array is fabricated by a novel method in which a two part mold is used. The array is made from a layer of thermoplastic material which is placed in the mold. Each cap in the array has a central portion and a perimeter wall. The mold is opened so that the array is carried by the first half. The array is applied to a wafer using the first half. After the arrays are applied, the wafer is separated into individual chips.
申请公布号 US6982189(B2) 申请公布日期 2006.01.03
申请号 US20030728930 申请日期 2003.12.08
申请人 SILVERBROOK RESEARCH PTY LTD 发明人 SILVERBROOK KIA
分类号 H01L21/44;H01L23/02;B29C33/38;B29C33/40;B29C35/08;B29C43/36;B29C45/12;B81B7/00;H01L21/00;H01L21/48;H01L21/50;H01L21/8238;H01L23/10;H01L23/12 主分类号 H01L21/44
代理机构 代理人
主权项
地址