发明名称 Plasma etching methods and contact opening forming methods
摘要 The invention includes etching and contact opening forming methods. In one implementation, a plasma etching method includes providing a bottom powered plasma chamber that includes a plasma generating electrode powerable at different first and second frequencies, with the first frequency being lower than the second frequency. A substrate is positioned over the electrode. A plasma is generated over the substrate with the electrode from a first applied power at the first frequency and a second applied power at the second frequency. A ratio of the first applied power to the second applied power is from 0 to 0.25 or at least 6.0. Material is etched from the substrate with the plasma.
申请公布号 US2005284843(A1) 申请公布日期 2005.12.29
申请号 US20040875330 申请日期 2004.06.23
申请人 HOWARD BRADLEY J;HINEMAN MAX F 发明人 HOWARD BRADLEY J.;HINEMAN MAX F.
分类号 H01L21/302;H01L21/311;(IPC1-7):H01L21/302 主分类号 H01L21/302
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