PROBE PIN FOR EXAMINING SEMICONDUCTOR DEVICE,申请号KR20040047866-传众专利搜索

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发明名称	PROBE PIN FOR EXAMINING SEMICONDUCTOR DEVICE
摘要
申请公布号	KR20050123309(A)	申请公布日期	2005.12.29
申请号	KR20040047866	申请日期	2004.06.24
申请人	SAE HAN MICRO TECH CO., LTD.	发明人	JEON, BYUNG HEE;PYO, CHANG RYUL;BAEK, BYEONG SEON
分类号	G01R1/067;H01L21/66;(IPC1-7):H01L21/66	主分类号	G01R1/067
代理机构		代理人
主权项
地址

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