Test pattern generating method, test pattern generating apparatus and storing medium stored with test pattern generating program being readable by computer

摘要

The present invention is a test pattern generating method. And the test pattern generating method provides a counting step for counting the number of faults becoming undetectable respectively, at each of states 0 and 1 that are able to be given to each of input pins of EOR gates when each of the EOR gates becomes a D frontier (different frontier) or a J frontier (justify frontier), a selecting step for selecting a state in which the number of faults becoming undetectable is smaller in the 0 and 1 states as an allocating state to the input pin, based on a counted result at the counting step, and step for generating the test pattern based on a selected state at the selecting step. With this, dynamic compaction can be effectively executed by restraining the increase of the number of test patterns.