| 摘要 |
A scrap-units-mapping system is disclosed. The system is especially designed for mapping a multi-layers PCB that contains a plurality of PCBs. The disclosed system comprised of an optical inspection system that scans each layer - both sides - of identified layers, that are intended to create a specific PCB, and marks the scrap-units on a layer map; a storage mean to store the layer maps, using any method for storing layers' information; and a combining software that combines the layer maps to create a PCB map, wherein each scrap-unit, which one of its' layers has a defect, is marked. Moreover, the system can further includes an optimization software that matches plurality of layer maps of each terrace-layer of the PCB and define sets of identified layers to join into a PCB with minimum scrap-units, enabling to collect each of the defined sets to join into a PCB. |
