发明名称 Electron beam diagnostic for profiling high power beams
摘要 A system for characterizing high power electron beams at power levels of 10 kW and above is described. This system is comprised of a slit disk assembly having a multitude of radial slits, a conducting disk with the same number of radial slits located below the slit disk assembly, a Faraday cup assembly located below the conducting disk, and a start-stop target located proximate the slit disk assembly. In order to keep the system from over-heating during use, a heat sink is placed in close proximity to the components discussed above, and an active cooling system, using water, for example, can be integrated into the heat sink. During use, the high power beam is initially directed onto a start-stop target and after reaching its full power is translated around the slit disk assembly, wherein the beam enters the radial slits and the conducting disk radial slits and is detected at the Faraday cup assembly. A trigger probe assembly can also be integrated into the system in order to aid in the determination of the proper orientation of the beam during reconstruction. After passing over each of the slits, the beam is then rapidly translated back to the start-stop target to minimize the amount of time that the high power beam comes in contact with the slit disk assembly. The data obtained by the system is then transferred into a computer system, where a computer tomography algorithm is used to reconstruct the power density distribution of the beam.
申请公布号 US2005285047(A1) 申请公布日期 2005.12.29
申请号 US20050159978 申请日期 2005.06.22
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA 发明人 ELMER JOHN W.;PALMER TODD A.;TERUYA ALAN T.
分类号 G01R19/00;H01J3/14;H01J37/244;(IPC1-7):H01J3/14 主分类号 G01R19/00
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