发明名称 Conductive structures in integrated circuits
摘要 A connective structure is formed by first depositing an insulator over a planarized surface. A trench is etched in the insulator. A barrier layer is deposited on the insulator. A seed layer is deposited on the barrier layer. The barrier layer and seed layer are selectively removed from areas of the insulator leaving an exposed seed area. A conductor is deposited on the exposed seed area. As many of these connective structures as desired may be stacked in an integrated circuit structure.
申请公布号 US2005285272(A1) 申请公布日期 2005.12.29
申请号 US20050216693 申请日期 2005.08.31
申请人 MICRON TECHNOLOGY, INC. 发明人 FARRAR PAUL A.
分类号 H01L21/768;(IPC1-7):H01L23/48 主分类号 H01L21/768
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