发明名称 Method of fabricating multi-gate transistor and multi-gate transistor fabricated thereby
摘要 Provided are a method of fabricating an improved multi-gate transistor and a multi-gate transistor fabricated using the method, which can reproduce a profile of a gate electrode in a stable manner. The method includes forming an active pattern on a substrate, the active pattern having two or more surfaces on which channel regions are to be formed, forming a gate insulating layer on the channel regions, and forming a patterned gate electrode on the gate insulating layer while maintaining a shape conformal to the active pattern.
申请公布号 US2005285161(A1) 申请公布日期 2005.12.29
申请号 US20050103115 申请日期 2005.04.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG TAE-WOONG;AHN JONG-HYON
分类号 H01L21/336;H01L21/84;H01L27/12;H01L29/423;H01L29/786;(IPC1-7):H01L27/12 主分类号 H01L21/336
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