发明名称 Semiconductor manufacturing apparatus and pattern formation method
摘要 In a pattern formation method employing immersion lithography, after a resist film is formed on a wafer, pattern exposure is performed by selectively irradiating the resist film with exposing light with a liquid including an unsaturated aliphatic acid, such as sunflower oil or olive oil including oleic acid, provided on the resist film. After the pattern exposure, the resist film is developed so as to form a resist pattern made of the resist film.
申请公布号 EP1610180(A2) 申请公布日期 2005.12.28
申请号 EP20050012156 申请日期 2005.06.06
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 ENDO, MASAYUKI;SASAGO, MASARU
分类号 G03F7/11;G03F7/00;G03F7/20;H01L21/027;H01L21/30;(IPC1-7):G03F7/20 主分类号 G03F7/11
代理机构 代理人
主权项
地址