INTERFEROMETER SYSTEM, PARTICULARLY FOR MEASURING SMALL ANGULAR DISPLACEMENTS,申请号PL20040368664-传众专利搜索

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发明名称	INTERFEROMETER SYSTEM, PARTICULARLY FOR MEASURING SMALL ANGULAR DISPLACEMENTS
摘要
申请公布号	PL368664(A1)	申请公布日期	2005.12.27
申请号	PL20040368664	申请日期	2004.06.21
申请人	POLITECHNIKA WROCLAWSKA	发明人	MASAJADA JAN
分类号	G02B26/00	主分类号	G02B26/00
代理机构		代理人
主权项
地址

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