发明名称 Method and apparatus for uniformly baking substrates such as photomasks
摘要 A method and apparatus for baking a film onto a substrate. A film, such as a layer of photoresist, is disposed on a first surface of a substrate while a second surface is exposed to a liquid bath. The liquid bath is maintained at a pre-selected temperature. Exposure of the substrate to the liquid bath allows the film on the opposite surface to bake. The liquid bath is then re-circulated to maintain a constant and uniform temperature gradient across the substrate.
申请公布号 US6979528(B2) 申请公布日期 2005.12.27
申请号 US20020314857 申请日期 2002.12.09
申请人 MICRON TECHNOLOGY, INC. 发明人 ROLFSON J. BRETT
分类号 B05C11/00;B05C13/00;G03F7/16;G03F7/38;G03F7/40;H01L21/00;(IPC1-7):G03F7/38;G03F7/26 主分类号 B05C11/00
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